AFM/Optical Microscope Calibration and Alignment Tool

AFM improves image rendition in the order of 1000 times the resolution of the optical diffraction limit. This AFM/Optical microscope alignment tool has been five years in the development.

It works well in eliminating cantilever tip alignment which is currently done by a numerical coordinate target that has to be first scanned by the AFM, and then aligned under the optical microscope (takes around 10-15 minutes).

Advantages of using the alignment tool are:

1) It provides an extremely quick tip alignment.

2) It views the AFM tip from below, aligning to the actual tip.

3) It uses a very high power optical microscope already present in the system to view, and align the tip.

4) It minimizes the approach time for the AFM tip to the sample surface.

5) It reduces accidental AFM head crashes.

Category:

Science & Technology

Tags:

• AFM
• optical
• cantilever
• tip
• alignment
• Atomic
• Force
• Microscope
• tool
• Olympus
• Calibration