The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling.
This video is part 6 of a 6-part series.
More information on the CMDITR wiki:
http://depts.washington.edu/cmditr/mediawiki/index.php?title=Scanning_Electro...
Great Videos!
didi0014 2 years ago 6