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JPK NanoWizard® AFM - tip scanner vs. sample scanner

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Uploaded by on Aug 3, 2009

Using the example of the NanoWizard®II atomic force microscope (AFM), this animation illustrates that only a tip-scanning AFM such as the NanoWizard®I, II or 3 from JPK Instruments truly enables simultaneous AFM and optical microscopy measurements.

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