This is a video screen capture off a Veeco/DI D3100 with an Invenios XY flexure scanner, scanning a read/write head. The Invenios flexure design enables extremely low out-of-plane motion and higher scan speeds than conventional AFM scanners. The video capture seen here is a 40 micron area from a 200 micron XY scanner, acquired at 8 Hz. Notice that the scan is flat and fast, curvature removal is not necessary with this scanner. These scanners are available for various types of AFM systems. For more details about the AFM scanner upgrade visit www.nanounity.com.
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