IFDIS

Conventional test equipment is very effective in troubling shooting hard failures but is severely limited when applied to testing for intermittent problems. The intermittent failing event rarely synchronizes with the measurement window during test time. This testing blind spot has been the leading contributor to the extensive No Fault Found (NFF) problem, until NOW!

Universal Synaptics Intermittent Fault Detectors (IFD) circuit testers were specifically designed to overcome these limitations. The neural-analog IFD tests all lines all the time in a simultaneous and continuous manner. The result is that intermittent events cannot be missed by the IFD. Our sensitive analog technology detects low amplitude, high speed (nano-second) impedance changes. The neural architecture of the IFD monitors all of the potential failure points at the same time and in parallel, the number of circuits or channels that can be tested simultaneously is virtually unlimited and are installed in 256-channel, test module increments. The IFDs digital processing provides fast, precise data-handling and failure location graphics to facilitate the rapid isolation of the failure source which will translate to a significant savings of time, man power, and resources.

Solve your NFF problems today for more information on this proven technology visit www.usynaptics.com or call 801.731.8508

Category:

Science & Technology

Tags:

• No Fault Found
• intermittence
• F-16
• F-15
• F-4
• A-10
• C-130
• Boeing
• Lockheed Martin
• Universal Synaptics
• NASA
• Air Force

[vinham1]

This technology is amazing....No Fault Found is a multi-million dollar a year problem - glad to learn there is a solution.

Keep up the good work