ASSET InterTech preview of Embedded World 2010

ASSET InterTech will be demonstrating the ScanWorks® Platform for Embedded Instruments at Embedded World 2010, Nuremberg, Germany, from 2nd-4th March on Logic Technology's stand 125 in hall 11.

The ScanWorks Platform for Embedded Instruments is the first unified environment to support validation, test and debug for both chips and boards. It combines boundary scan test, processor-controlled test, Intel® Interconnect BIST (IBIST) and core instrumentation to provide universal fault coverage for both chips and boards.

ScanWorks provides important benefits throughout the chip-board-system development and manufacturing cycles. It allows the reuse of validation and test routines that are developed early in the cycle, cutting product lead times and test development costs. Having a common software based validation and test environment will help replace expensive and ineffective probe-based hardware, much of which has become redundant due to lack of access and ever increasing signal speeds.This in turn will also allow failures to be located much earlier in a products life cycle. The cost of failure increases exponentially the further along the cycle that it occurs. ScanWorks can help you save on this considerable expense.

Find out more about ScanWorks on our website:
www.asset-intertech.com

Category:

Science & Technology

Tags:

• ASSET InterTech
• ScanWorks
• boundary scan test
• JTAG
• processor-controlled test
• CPU emulation
• Intel Interconnect BIST
• Intel IBIST
• core instrumentation
• IEEE 1149.1
• IEEE 1149.7
• IEEE 1500
• IEEE P1687
• board test
• dead board debug
• board validation
• chip test
• chip characterization
• chip debug
• embedded IP