Measurement of straightness using a LP30 compact laser interferometer

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Uploaded by on Dec 25, 2008

LP30 compact laser interferometer can be used to inspect accuracy simultaneously along the horizontal (XY) and vertical (XZ) plane with a single displacement of the carriage. This example employs the Wollastone optical system for high accuracy, but similar results can be easily obtained with the patented 3D software opion, using the laser interferometer (on the moving slide) and the reflector (fixed). Using a standard level, it is only possible to inspect straigthness along the vertical plane (XZ)

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