Hiroshi Iwai, Kyoto University

Analysis of Electrode Microstructure Based on FIB-SEM Technology: Activities in Kyoto Univ. and The Univ. of Tokyo

Hiroshi Iwai, Naoki Shikazono, Toshiaki Matsui

This presentation reports recent results of the collaborative research activities based on the FIB-SEM technology obtained by a group of three laboratories in Kyoto University and the University of Tokyo. Under a framework of NEDO (New Energy and Industrial Technology Development Organization, Japan) project on SOFC reliability and durability, an important aim of the group is to find correlation between the change of the electrode microstructure and the cell degradation. The activities can be classified into the following four topics.

1. Electrochemical evaluation of degradation during operation

2. Cell evaluation and diagnosis of degradation factors

3. Observation of 3-D microstructure to build database

4. Development of simulation technology based on 3-D microstructural data

Symposium on Solid oxide cell electrodes in 3D

Category:

Science & Technology

Tags:

• SOFC
• FIB-SEM
• Tomography
• 3D
• microstructure
• modelling Kyoto University
• University of Tokyo
• Hiroshi Iwai
• Naoki Shikazono
• Toshiaki Matsui