The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling.
This video is part 2 of a 6-part series.
More information on the CMDITR wiki:
http://depts.washington.edu/cmditr/mediawiki/index.php?title=Scanning_Electro...
if you initially set it to 30 kv, why did it change to 5? btw very nice videos! im in love with these machines :) any info you have on pictures or videos of atoms is greatly appreciated as well
joshuaalayon 6 months ago
@joshuaalayon
Oops! you caught a little video consistency problem, we shot this procedure several times and edited it together. The operating power is gradually increased from 5 to 30kv and then it stays there until it is changed.
cmditr 6 months ago