The BRR Microscope - A Hybrid SEM+AFM Combination

The first fully integrated Scanning Electron - Scanning Probe Microscope. Fully integrated in both hardware and software, adds the 3rd dimension to your Carl Zeiss SEM. The BRR provides single software interface for both AFM and SEM use, usage of standard AFM silicon cantilevers, tilt angles from 0° (top view) to approx. 80° (side view). Supports sharpening the cantilever tip by FIB from 0° position. Minimum working distance approx. 4.9 mm.

Available as an addon to Carl Zeiss Scanning Electron Microscopes with Gemini(R) column.

For additional information visit the DME website http://www.dme-spm.com
(C) DME - Danish Micro Engineering A/S, DME Nanotechnologie GmbH

Category:

Science & Technology

Tags:

• SEM
• AFM
• SPM
• electron
• microscope
• scanning
• probe
• view
• afm
• tip
• STM
• tunneling
• nanotechnology
• high
• resolution
• surface
• analysis
• hybrid

[medirobe]

Thank you for sharing this... :) I've got a Q though, Is it possible for the downward force of the microscope's tip to destroy the item being scanned or magnified?

[Gnudelsalat]

@medirobe When AFMs are operated the right way, they commonly do not modify the area that is scanned. In some cases this modification is wanted, (called "Lithography") where one wants to manipulate the surface and create some nano structures or scratches on the surface. If the instrument is operated the wrong way, the surface and tip can easily get destroyed, for example when the sample is moved during scanning or the wrong tip is used.

[medirobe]

@Gnudelsalat You've actually answered my curiosity... thank you so much... Excuse my late reply. :)

[MrBigskydaddy]

Very cool! Thanks for the video