3D Reconstruction in a Tescan FIB/SEM Nano-Workstation

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Uploaded by on Jul 8, 2011

Watch as a combined focused ion beam and scanning electron microscope system manufactured in the Czech Republic by Tescan is able to slice through material and image on the nanoscale. By doing this through the bulk volume of the material it becomes possible to create a visual data cube. This data cube can be processed and manipulated. In the end of the video, you actually "fly" through the sample at nanometer scale.

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