Atomic Force Microscopy on iPhone and HOPG

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Uploaded by on Dec 18, 2011

The iPhone display is extremely flat and therefore an ideal real-life test object for evaluating the performance of an AFM, also because it's the same all over the world. This video shows an uncut approx. eight minute demo sequence of setting up the the DME DualScope(TM) 95-50 AFM system by inserting a cantilever and scanning two different samples. The first sample is a Highly Ordered Pyrolytic Graphite (HOPG) sample exhibiting atomic layer steps at the surface. The second sample is the iPhone. The DualScope AFM scanners are probe scanners, where the tip is moved for the scanning operation instead of the sample, where most other high-resolution AFMs are sample scanners. Probe scanners allow also investigating large and heavy samples like an iPhone.

The measurement has been performed at DME Nanotechnologie GmbH, Hannover, Germany. Visit our web site http://www.dme-spm.com or http://www.dme-spm.de

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