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Automated Optical Inspection | AOI System

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Uploaded by on Jul 22, 2011

Nanovea Automated Optical Inspection (AOI) utilizes leading edge optical pens using superior white light axial chromatism. Nano through macro range is automatically obtained during measurement (Profile Dimension, Roughness Finish Texture, Shape Form Topography, Flatness Warpage, Volume Area, Step-Height Depth Thickness and others) on a wider range of geometries and materials than any other vision or laser based optical inspection system. With the use of a large range of optical pens optical inspection can precisely measures an endless range of applications. Nanovea optical inspection has zero influence from sample reflectivity, variations require no sample preparation and have advanced ability to measure high surface angles. Easily measure any material: transparent, opaque, specular, diffusive, polished, rough etc. Unlike other optical measurement techniques, large surface areas can be precisely measured without any imaging stitching. Nanovea Profilometers can be built with custom size, speeds, scanning capabilities, Class 1 Clean Room compliance, with Indexing Conveyor and for Inline or online.

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  • sorry but I think it works fairly slow, is it intended for mass production purposes?

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