Scanning Electron Microscope Analysis - IPS Testing.wmv

In this video, we take a closer look at a Paper Maker's felt under the SSEM as well as its composition using elemental analysis.

The Scanning Electron Microscope (SEM) is a highly effective and versatile tool for investigating textures and structures that are difficult or impossible to see with the optical microscope. The SEM uses electrons, which have a much shorter wavelength than visible light. Consequently, surfaces can be examined at much greater magnification, resolving power and depth of field.

The Jeol SEM at IPS is capable of resolving features as small as several hundreds of nanometers in size and at magnifications up to 60,000 times. In addition, with its superior depth of focus and contrast, the SEM also is capable of illustrating textures and shapes in the magnification range of the low power dissecting microscope of 10X to 100X.

The SEM capabilities at IPS are ideal for identifying inorganic contaminants, inclusions, surface textures, fracture surfaces, structural and compositional characteristics of prepared cross sections. Combined with our Image Analysis capabilities, textures and structures also can be quantified.
Let us help you with your SEM imaging needs!

Visit www.ipstesting.com for more information.

Category:

Science & Technology

Tags:

• SEM
• Scanning Electron Microscopy
• Paper Maker's Felt
• Paper Insdustry
• Jeol SEM
• Elemental Analysis
• Product Reverse Engineering