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http://sunx.jp/japanese/products/microscope/mv-s/index.html
SUNX exhibited its MV-S Series of fine microscopes at the Laser & Optics 2009 Exhibition, which was held at the Tokyo Big Sight exhibition center.
The unique feature of this fine microscope is that the sample can be rotated 360 degrees even when the stage is secured and as a result, the sample can be easily observed with a 3D panoramic view. The microscope also provides a deep depth of field so that the sample is always in full focus, and as a result, the microscope enables a shared observation environment in which high resolution, detailed inspection images can be observed not only by one person but by many staff members at the same time.
The MV-S Series is also equipped with a Master View function that draws a marker on the image, with a Live Measurement function that can be used to take measurements while observing the sample, and with a Direct Report function that can be used to create Excel reports with just one click. Sales of the MV-S Series began in 2006 and the microscopes are now widely used in laboratories and at factories and other manufacturing sites because visual inspections and such can be easily conducted. Next the company intends to further expand sales nationwide.
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