Focused ion beam (FIB) video of the in situ template stripping process. Both a rectangular and a circular silver patch (~30 microns across) are stripped out, which can then be placed elsewhere in the chamber for further imaging, characterization, or micro- & nanomachining.
Source:
http://dx.doi.org/10.1021/nl2005737
N.C. Lindquist et al., Nano Letters (2011)
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