Focused Ion Beam SEM

Focused Ion Beam SEM. Video showing various accessories, including the EBSD, Cryo stage and the inside chamber view.
FIB, is a technique used particularly in materials science fields for site-specific analysis, deposition, and ablation of materials.
For more info: http://www.ictas.vt.edu/facilities/ncfl.shtml

Category:

Science & Technology

Tags:

• FIB
• SEM
• Nanofabrication
• TEM lift-out
• Cryo-Imaging
• Carbon nanotubes.

[brandonhughes7]

so what dose it do exactly. what I mean by that is what would it be used for.

[gsinghcuboulder]

@brandonhughes7 Several applications: Cutting, etching and depositing material at the nanoscale. Imaging cross-section of frozen biological cells. Pick and place of nanomaterials. Preparation of thin TEM specimens etc. etc.

[brandonhughes7]

@brandonhughes7 that could be very usefull