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Non-contact 3D Topography Measurement of Solar Cells with the NEMESIS system from Precitec Optronik GmbH

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Uploaded by on Aug 15, 2008

High accuracy 3D topography measurement with just a light beam.

This video shows a 3D topography measurement of a solar cell conductor (finger). The used system is the NEMESIS VVX scanning system from Precitec Optronik GmbH in Germany. The used optical sensor is the chromatic white-light sensor CHRocodile E. The accuracy of this surface measurement is 100 nm.

More information under: www.precitec-optronik.de

This system can also measure the thickness of wafers and solar cells from one side without contact.

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