High accuracy 3D topography measurement with just a light beam.
This video shows a 3D topography measurement of a solar cell conductor (finger). The used system is the NEMESIS VVX scanning system from Precitec Optronik GmbH in Germany. The used optical sensor is the chromatic white-light sensor CHRocodile E. The accuracy of this surface measurement is 100 nm.
More information under: www.precitec-optronik.de
This system can also measure the thickness of wafers and solar cells from one side without contact.
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