Scanning Electron Microscope: Pt 5 of 6

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Uploaded by on Jan 19, 2010

The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling.
This video is part 5 of a 6-part series.

More information on the CMDITR wiki:
http://depts.washington.edu/cmditr/mediawiki/index.php?title=Scanning_Electro...

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Uploader Comments (cmditr)

  • What is the material youre looking at??

  • @GanEdenAustralia

    Hello. The sample is a standard gold nanoparticles on carbon.

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  • love the video really good

  • some great inforamtion here thanks

  • its real that this microscope can reach 0.2 nm ?

  • this reminds me of man on the moon

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